Share Email Print
cover

Proceedings Paper

Research on rapid agile metrology for manufacturing based on real-time multitask operating system
Author(s): Jihong Chen; Zhen Song; Daoshan Yang; Ji Zhou; Shawn Buckley
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Rapid agile metrology for manufacturing (RAMM) using multiple non-contact sensors is likely to remain a growing trend in manufacturing. High speed inspecting systems for manufacturing is characterized by multitasks implemented in parallel and real-time events which occur simultaneously. In this paper, we introduce a real-time operating system into RAMM research. A general task model of a class-based object- oriented technology is proposed. A general multitask frame of a typical RAMM system using OPNet is discussed. Finally, an application example of a machine which inspects parts held on a carrier strip is described. With RTOS and OPNet, this machine can measure two dimensions of the contacts at 300 parts/second.

Paper Details

Date Published: 31 October 1996
PDF: 8 pages
Proc. SPIE 2908, Machine Vision Applications, Architectures, and Systems Integration V, (31 October 1996); doi: 10.1117/12.257262
Show Author Affiliations
Jihong Chen, Huazhong Univ. of Science and Technology (China)
Zhen Song, Huazhong Univ. of Science and Technology (China)
Daoshan Yang, Huazhong Univ. of Science and Technology (China)
Ji Zhou, Huazhong Univ. of Science and Technology (China)
Shawn Buckley, CogniSense, Inc. (United States)


Published in SPIE Proceedings Vol. 2908:
Machine Vision Applications, Architectures, and Systems Integration V
Susan Snell Solomon; Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

© SPIE. Terms of Use
Back to Top