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Proceedings Paper

Dual-path imaging spectrometer and peak-up camera for SIRTF/IRS
Author(s): Robert J. Brown; James R. Houck
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Paper Abstract

The optical design of a dual path imaging spectrometer and peak up camera for the IRS instrument on the SIRTF mission is discussed. The dual path configuration allows for a single area array to be simultaneously used for both low resolution spectroscopy and high resolution imagery without overlapping. This is accomplished by the use of off-axis reflective Schmidt cameras in each optical path. These cameras provide a high resolution image and a low resolution spectral image that reside side-by-side on the focal plane without residing side-by-side in the object field.

Paper Details

Date Published: 1 November 1996
PDF: 6 pages
Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996); doi: 10.1117/12.256232
Show Author Affiliations
Robert J. Brown, Ball Aerospace and Technologies Corp. (United States)
James R. Houck, Cornell Univ. (United States)


Published in SPIE Proceedings Vol. 2863:
Current Developments in Optical Design and Engineering VI
Robert E. Fischer; Warren J. Smith, Editor(s)

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