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Proceedings Paper

Optical design for a breadboard high-resolution spectrometer for SIRTF/IRS
Author(s): Robert J. Brown; James R. Houck; Jeffrey E. Van Cleve
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Paper Abstract

The optical design of a breadboard high resolution infrared spectrometer for the IRS instrument on the SIRTF mission is discussed. The spectrometer uses a crossed echelle grating configuration to cover the spectral region from 10 to 20 micrometer with a resolving power of approximately equals 600. The all reflective spectrometer forms a nearly diffraction limited image of the two dimensional spectrum on a 128 multiplied by 128 arsenic doped silicon area array with 75 micrometer pixels. The design aspects discussed include, grating numerology, image quality, packaging and alignment philosophy.

Paper Details

Date Published: 1 November 1996
PDF: 5 pages
Proc. SPIE 2863, Current Developments in Optical Design and Engineering VI, (1 November 1996); doi: 10.1117/12.256226
Show Author Affiliations
Robert J. Brown, Ball Aerospace and Technologies Corp. (United States)
James R. Houck, Cornell Univ. (United States)
Jeffrey E. Van Cleve, Cornell Univ. (United States)


Published in SPIE Proceedings Vol. 2863:
Current Developments in Optical Design and Engineering VI
Robert E. Fischer; Warren J. Smith, Editor(s)

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