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Proceedings Paper

Light yield and Fano factor for x rays in xenon gas proportional scintillation counters
Author(s): Filipa I. G. Melo Borges; Joaquim M. F. dos Santos; S. Kubota; Carlos Alberto Na Conde
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Paper Abstract

The light yield, or electroluminescence yield, of pure xenon for reduced electric fields below the ionization threshold (about 6 Vcm-1torr-1) was measured for pressures of 825, 570 and 276 torr using a uniform field gas proportional scintillation counter excited with 5.9 keV x rays. A linear behavior was exhibited from the 1 Vcm-1torr-1 electroluminescence threshold, but the measured yield (for lambda greater than 165 nm) diminished with the gas pressure. The best energy resolution obtained was 7.6% for collimated 5.9 keV x rays with xenon at 825 torr. A Fano factor of 0.26 was measured for the three xenon pressures.

Paper Details

Date Published: 31 October 1996
PDF: 4 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256035
Show Author Affiliations
Filipa I. G. Melo Borges, Univ. of Coimbra (Portugal)
Joaquim M. F. dos Santos, Univ. of Coimbra (Portugal)
S. Kubota, Univ. of Coimbra (Portugal)
Carlos Alberto Na Conde, Univ. of Coimbra (Portugal)

Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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