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Proceedings Paper

Effect of the Al thickness on the performance of Nb/Al/AlOx/Al/Nb superconducting tunnel junctions used as x-ray detectors
Author(s): Abel Poelaert; Peter Verhoeve; Nicola Rando; Anthony J. Peacock; D. J. Goldie; R. Venn
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Paper Abstract

Nb/Al/AlOx/Al/Nb superconducting tunnel junctions (STJs) have been studied extensively as photon detectors, because of their intrinsic capabilities in terms of charge output and energy resolving power. A critical element in such an STJ is the aluminum layer which separates the superconductive Nb from the AlOx tunnel barrier. In this paper, the role of this Al layer is investigated. The behavior of high quality STJs, differing by the Al thickness only, is analyzed. Five thicknesses ranging between 5 nm and 120 nm are considered. The charge output, the energy linearity and resolution for the case of 6 keV x-ray photons are discussed.

Paper Details

Date Published: 31 October 1996
PDF: 11 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256025
Show Author Affiliations
Abel Poelaert, European Space Agency/ESTEC (Netherlands)
Peter Verhoeve, European Space Agency/ESTEC (Netherlands)
Nicola Rando, European Space Agency/ESTEC (Netherlands)
Anthony J. Peacock, European Space Agency/ESTEC (Netherlands)
D. J. Goldie, Oxford Instruments (United Kingdom)
R. Venn, Cambridge Microfab Ltd. (United Kingdom)

Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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