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Proceedings Paper

XMM Optical/UV Monitor Telescope
Author(s): Keith O. Mason; Mark S. Cropper; R. Hunt; Scott D. Horner; William C. Priedhorsky; Cheng Ho; France Anne Cordova; Claude A. J. Jamar; Elio Antonello
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Paper Abstract

The optical/UV monitor (OM) on the ESA x-ray cornerstone mission XMM is designed to provide simultaneous optical and UV coverage of x-ray targets viewed by the observatory. The instrument consists of a 30 cm modified Ritchey-Chretien telescope. This feeds a compact photon counting detector operating in the blue part of the optical spectrum and the UV (1600 - 6000 angstrom). The OM has a square field of view of approximately 24 arcmin along the diagonal, and will cover the central region of the field of view of the EPIC x- ray cameras where the x-ray image quality is best. Because of the low sky background in space, the sensitivity of the OM for detecting stars will be comparable to that of a 4-m telescope at the Earth's surface; it should detect a B equals 24th magnitude star in a 1000 s observation using unfiltered light. The pixel size of the detector corresponds to 0.5 arc seconds on the sky in normal operation. In front of each of two redundant detectors are filter wheels containing broad band filters. The filter wheels also contain Grisms for low resolution spectroscopy of brighter sources (lambda/Delta lambda 200) and a 4x field expander which will allow high spatial resolution images of the field center to be taken in optical light.

Paper Details

Date Published: 31 October 1996
PDF: 10 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256021
Show Author Affiliations
Keith O. Mason, Univ. College London (United Kingdom)
Mark S. Cropper, Univ. College London (United Kingdom)
R. Hunt, Univ. College London (United Kingdom)
Scott D. Horner, The Pennsylvania State Univ. (United States)
William C. Priedhorsky, Los Alamos National Lab. (United States)
Cheng Ho, Los Alamos National Lab. (United States)
France Anne Cordova, Univ. of Calif./Santa Barbara (United States)
Claude A. J. Jamar, Univ. de Liege (Belgium)
Elio Antonello, Osservatorio Astronomico di Brera (Italy)


Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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