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Proceedings Paper

Performance of an optical filter for the XMM focal plane CCD camera EPIC
Author(s): Karl-Heinz Stephan; Claus Reppin; Marieluise Hirschinger; Hans-Joerg Maier; Dagmar Frischke; Detlef Fuchs; Peter Mueller; Peter Guertler
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Paper Abstract

We have been developing optical filters for ESA's x-ray astronomy project XMM (x-ray multi mirror mission). Specific CCDs will be used as detectors in the focal plane on board the observatory. Since these detectors are sensitive from the x-ray to the NIR (near infrared) spectral range, x-ray observations require optical filters, which combine a high transparency for photon energies in the soft x-ray region and a high opacity for UV (ultraviolet) and VIS (visible) radiation as well. With respect to the mission goal in orbit three types of flight model filters are designed having different spectral transmittance functions. We report on one of these types, a so-called 'thick' filter, which has been realized within the EQM (electrical qualification model)- phase of the project. The filter features a cut-off in the EUV (extreme ultraviolet) spectral range and suppresses radiation below 10 eV photon energy by more than 8 orders of magnitude. It has an effective aperture of 73 mm without any support structure. A 0.35 micrometer thick polypropylene carrier foil is coated with metallic films of Al and Sn. The manufacturing process, the qualification measurements and the environmental tests are described, and the resulting performance data is presented.

Paper Details

Date Published: 31 October 1996
PDF: 17 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256018
Show Author Affiliations
Karl-Heinz Stephan, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Claus Reppin, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Marieluise Hirschinger, Max-Planck-Institut fuer Extraterrestrische Physik (Germany)
Hans-Joerg Maier, Ludwig-Maximilians-Univ. Muenchen (Germany)
Dagmar Frischke, Ludwig-Maximilians-Univ. Muenchen (Germany)
Detlef Fuchs, Physikalisch-Technische Bundesanstalt (Germany)
Peter Mueller, Physikalisch-Technische Bundesanstalt (Germany)
Peter Guertler, HASYLAB am DESY (Germany)


Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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