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Proceedings Paper

Radiation damage of the x-ray CCD
Author(s): Hiroshi Tomida; Hironori Matsumoto; Masanobu Ozaki; Yuji Tazawa; Hisamitsu Awaki; Takeshi G. Tsuru; Katsuji Koyama; Hiroshi Tsunemi; Koei Yamamoto
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Paper Abstract

We studied the proton damage effects of the x-ray CCD. We have measured x-ray CCD performances after the irradiation of energies at 2 and 9.5 MeV, and confirmed clear degradation of charge transfer efficiency (CTE) and the energy resolution. To recover degraded CTE and the energy resolution, we tried the charge injection technique, and found the improvement of CTI and the energy resolution to be one-quarter and one-third, respectively. We also estimated the energy level of the deep trap, which causes the quantization of the dark current from the radiation-damaged pixels. The trap energy level is about 0.57 eV, or near the center of forbidden band.

Paper Details

Date Published: 31 October 1996
PDF: 10 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.255999
Show Author Affiliations
Hiroshi Tomida, Kyoto Univ. (Japan)
Hironori Matsumoto, Kyoto Univ. (Japan)
Masanobu Ozaki, Kyoto Univ. (Japan)
Yuji Tazawa, Kyoto Univ. (Japan)
Hisamitsu Awaki, Kyoto Univ. (Japan)
Takeshi G. Tsuru, Kyoto Univ. (Japan)
Katsuji Koyama, Kyoto Univ. (Japan)
Hiroshi Tsunemi, Osaka Univ. (Japan)
Koei Yamamoto, Hamamatsu Photonics KK (Japan)


Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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