Share Email Print
cover

Proceedings Paper

Measurement of the transmission of the UV/ion shields for the AXAF High-Resolution Camera
Author(s): G. R. Meehan; Almus T. Kenter; Ralph Porter Kraft; Stephen S. Murray; Martin V. Zombeck; K. Kobayashi; John H. Chappell; Marco Barbera; Alfonso Collura
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The Advanced X-ray Astrophysics Facility (AXAF) is scheduled for launch in summer/fall 1998. One of its two focal plane instruments is the high resolution camera (HRC). The HRC consists of two detectors; an imaging detector (HRC-I) and a detector (HRC-S) for the spectroscopic read-out of the low energy transmission grating (LETG). Both detectors are comprised of a chevron pair of microchannel plates with a crossed grid charge detector (CGCD) and a UV/ion shield (UVIS). Each UVIS is mounted as a free standing window in front of the MCPs. The HRC-I UVIS is 10 cm multiplied by 10 cm and consists of 5000 angstrom polyimide, one side of which is coated with 700 angstrom aluminum. The other side is coated with 200 angstroms of carbon. The HRC-S UVIS consists of three 3 cm multiplied by 10 cm segments. The thickness of the polyimide film (2000 - 2500 angstrom) and of the aluminum coating (300 - 2000 angstrom) of each segment has been varied to optimize the shield's performance with the LETG. In this paper, x-ray transmission models are presented. Results of laboratory x-ray transmission measurements of the flight HRC-I UVIS at various energies in the range of 0.1 to 1.5 keV, as well as results of x-ray transmission measurements of a flight UVIS-I witness sample, are discussed. Results of UV transmission measurements of a flight UVIS-I witness sample also are presented.

Paper Details

Date Published: 31 October 1996
PDF: 19 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.255995
Show Author Affiliations
G. R. Meehan, Smithsonian Astrophysical Observatory (United States)
Almus T. Kenter, Smithsonian Astrophysical Observatory (United States)
Ralph Porter Kraft, Smithsonian Astrophysical Observatory (United States)
Stephen S. Murray, Smithsonian Astrophysical Observatory (United States)
Martin V. Zombeck, Smithsonian Astrophysical Observatory (United States)
K. Kobayashi, Smithsonian Astrophysical Observatory (United States)
John H. Chappell, Smithsonian Astrophysical Observatory (United States)
Marco Barbera, Istituto e Osservatorio Astronomico G.S. Vaiana (Italy)
Alfonso Collura, Istituto e Osservatorio Astronomico G.S. Vaiana (Italy)


Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

© SPIE. Terms of Use
Back to Top