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Proceedings Paper

Flight x-ray CCD selection for the AXAF CCD Imaging Spectrometer
Author(s): Michael J. Pivovaroff; Steven E. Kissel; Mark W. Bautz; Gregory Y. Prigozhin; Takashi Isobe; Jonathan W. Woo; James A. Gregory
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Paper Abstract

As part of our program to select and calibrate flight- quality, x-ray CCD detectors for the AXAF CCD imaging spectrometer, we have developed efficient detector screening methods. Our screening protocol, which measures device-level performance parameters (including noise, dark current and charge transfer efficiency) as well as x-ray spectral resolution in the 0.3 - 6 keV band, allows us quickly to identify which of the greater than 30 flight candidate detectors warrant the expenditure of severely limited time available for calibration. The performance criteria used to rank devices are discussed, and the details of the measurement methods are presented. Summary results of the screening measurements are presented for a large sample of devices, and detailed data on selected devices are described. We find that the performance variations among the sample of flight devices to be relatively small but significant.

Paper Details

Date Published: 31 October 1996
PDF: 12 pages
Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.255993
Show Author Affiliations
Michael J. Pivovaroff, Massachusetts Institute of Technology (United States)
Steven E. Kissel, Massachusetts Institute of Technology (United States)
Mark W. Bautz, Massachusetts Institute of Technology (United States)
Gregory Y. Prigozhin, Massachusetts Institute of Technology (United States)
Takashi Isobe, Massachusetts Institute of Technology (United States)
Jonathan W. Woo, Massachusetts Institute of Technology (United States)
James A. Gregory, MIT Lincoln Lab. (United States)


Published in SPIE Proceedings Vol. 2808:
EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII
Oswald H. W. Siegmund; Mark A. Gummin, Editor(s)

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