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Proceedings Paper

Skin effect in high-speed ULSI/VLSI packages
Author(s): Lih-Tyng Hwang; Iwona Turlik
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Paper Abstract

As the rise time of digital pulses is reduced to the subnanosecond range the skin effect becomes an important issue in high-speed digital systems. In this paper the various approaches (theoretical and experimental) which have been taken to study the skin effect are surveyed. Various methods that accommodate the skin effect phenomenon into conductor design rules for high-speed digital systems are examined and compared. The resulting impact of these accommodations on high performance ULSI/VLSI multichip packages is addressed.

Paper Details

Date Published: 1 April 1991
PDF: 12 pages
Proc. SPIE 1390, Microelectronic Interconnects and Packages: System and Process Integration, (1 April 1991); doi: 10.1117/12.25581
Show Author Affiliations
Lih-Tyng Hwang, Microelectronics Ctr. of North Carolina (United States)
Iwona Turlik, Microelectronics Ctr. of North Carolina (United States)


Published in SPIE Proceedings Vol. 1390:
Microelectronic Interconnects and Packages: System and Process Integration
Stuart K. Tewksbury; John R. Carruthers, Editor(s)

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