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Proceedings Paper

Perturbation methods in field and transfer matrix calculation: an extension of analytical methods in electron optics
Author(s): Mikhail Igorevitch Yavor
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Paper Abstract

The paper discusses a possibility of application of perturbation methods to calculation of field distributions and optical properties of various electron and ion optical systems.

Paper Details

Date Published: 25 October 1996
PDF: 10 pages
Proc. SPIE 2858, Charged-Particle Optics II, (25 October 1996); doi: 10.1117/12.255504
Show Author Affiliations
Mikhail Igorevitch Yavor, Institute for Analytical Instrumentation (Russia)


Published in SPIE Proceedings Vol. 2858:
Charged-Particle Optics II
Eric Munro, Editor(s)

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