Share Email Print
cover

Proceedings Paper

Breakdown at window interfaces caused by high-power microwave fields
Author(s): James C. Dickens; J. Elliott; Lynn L. Hatfield; Magne Kristiansen; Hermann Krompholz
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Breakdown phenomena at window interfaces are investigated for microwave power levels of up to 100 MW. The test stand utilizes a 3 MW magnetron operating at 2.85 GHz, coupled to an S-band traveling wave resonant ring. Various configurations of dielectric windows (i.e. vacuum-air, or vacuum-vacuum), in various geometries (standard pillbox geometry, or windows filling the S-band waveguide cross section) can be investigated. Diagnostics include the measurement of transmitted and reflected microwave power, luminosity from the discharge plasma, x-ray emission from initially free electrons, and electric field probes. All these quantities are measured with high amplitude and high temporal (0.2...1 ns) resolution. Goals are to determine the physical mechanisms--such as the dominant electron multiplication process--leading to the flashover. The knowledge gained from these experiments will be used to investigate and design methods to increase the power density which can be transmitted through windows. In addition, parametric studies are planned, in which window material, profile, and surface coatings are varied. The basic system and the diagnostics methods will be expanded for the investigation of microwave cavity breakdown as well.

Paper Details

Date Published: 28 October 1996
PDF: 7 pages
Proc. SPIE 2843, Intense Microwave Pulses IV, (28 October 1996); doi: 10.1117/12.255407
Show Author Affiliations
James C. Dickens, Texas Tech Univ. (United States)
J. Elliott, Texas Tech Univ. (United States)
Lynn L. Hatfield, Texas Tech Univ. (United States)
Magne Kristiansen, Texas Tech Univ. (United States)
Hermann Krompholz, Texas Tech Univ. (United States)


Published in SPIE Proceedings Vol. 2843:
Intense Microwave Pulses IV
Howard E. Brandt, Editor(s)

© SPIE. Terms of Use
Back to Top