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Proceedings Paper

METRICOR 2000: a multiparameter fiber optic sensor instrument
Author(s): Philippe Graindorge; Bernard Laloux; Marc Girault; Philippe Martin; Herve C. Lefevre; Francois X. Desforges
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Paper Abstract

The METRICOR 2000 instrument has been developed as a solution to numerous needs for fiber optic sensors in metrology and in process control. It is able to measure over 20 different physical parameters through three different operating principles, corresponding to three different conditioners. A first intensity conditioner is designed to deal with signal generated by probes with a limited dynamic range. It is particularly suited for on/off sensors such as level detection and void fraction probes. A dual wavelength conditioner handles signals generated by probes requiring referenced operation. It can be used with opacimetry and chemical concentration probes as well as fail-safe dual wavelength on/off type sensors. A third conditioner deals with the complex signal generated by interferometric sensors. Those sensors, operating under a white light illumination, return a spectrally encoded information which is not affected by on-line attenuation. This third conditioner can be used with micro-machined interferometric temperature, pressure or index of refraction sensors. It offers the highest performance in resolution and accuracy. The standard mainframe unit includes a display for 4 simultaneous measurements. Each probe is equipped with an electronic personality key which includes the calibration.

Paper Details

Date Published: 25 October 1996
PDF: 10 pages
Proc. SPIE 2839, Fiber Optic and Laser Sensors XIV, (25 October 1996); doi: 10.1117/12.255342
Show Author Affiliations
Philippe Graindorge, Photonetics SA (France)
Bernard Laloux, Photonetics SA (France)
Marc Girault, Photonetics SA (France)
Philippe Martin, Photonetics SA (France)
Herve C. Lefevre, Photonetics SA (France)
Francois X. Desforges, Photonetics Inc. (United States)


Published in SPIE Proceedings Vol. 2839:
Fiber Optic and Laser Sensors XIV
Ramon P. DePaula; John W. Berthold, Editor(s)

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