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Proceedings Paper

Applications of diode laser spectroscopy to environmental and industrial process monitoring
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Paper Abstract

Visible/near-infrared diode lasers are well-suited for use as spectroscopic light sources in detection of a wide variety of gases by optical absorption. The high spectral resolution of these devices permits the selective detection of targeted species, while their characteristics of low cost, room temperature operation, and compatibility with fiber optics make them attractive for instrument development. A partial list of industrially or environmentally significant gases that may be measured by near-IR diode laser spectroscopy includes oxygen, water vapor, methane, acetylene, carbon monoxide, carbon dioxide, hydrogen halides, ammonia, hydrogen sulfide, and nitrogen oxides. This paper describes recent work at Southwest Sciences in development of diode laser-based instrumentation for industrial or environmental monitoring applications. Instrumentation utilizing a 1.393 micrometers DFB diode laser for measurement of trace moisture contamination in high purity process gases is described. In addition, recent laboratory studies to characterize the performance of new types of diode lasers in gas sensing applications are discussed, including vertical cavity surface emitting lasers in the 650 to 960 nm region and antimonide-based lasers in the 2.6 micrometers region.

Paper Details

Date Published: 21 October 1996
PDF: 5 pages
Proc. SPIE 2834, Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring, (21 October 1996); doi: 10.1117/12.255337
Show Author Affiliations
Alan C. Stanton, Southwest Sciences, Inc. (United States)
Joel A. Silver, Southwest Sciences, Inc. (United States)
David S. Bomse, Southwest Sciences, Inc. (United States)
Daniel B. Oh, Southwest Sciences, Inc. (United States)
D. Christian Hovde, Southwest Sciences, Inc. (United States)
Mark E. Paige, Southwest Sciences, Inc. (United States)
Daniel J. Kane, Southwest Sciences, Inc. (United States)


Published in SPIE Proceedings Vol. 2834:
Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring
Alan Fried, Editor(s)

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