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Proceedings Paper

Flash photolysis/tunable diode laser absorption spectroscopy studies of HCl as a product of the reactions: Cl + C2H6 and Cl + CH3CHO
Author(s): Carla S. Kegley-Owen; Geoffrey S. Tyndall; John J. Orlando; Alan Fried
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Paper Abstract

A time-resolved flash photolysis/tunable diode laser absorption spectroscopy system has been constructed to study reaction products of gas-phase chemical reactions. The use of FP to initiate the chemistry results in essentially a wall-less reactor due to the time of reaction being much shorter than the time of diffusion. The use of TDLAS allows the time-resolved detection of HCl by monitoring individual lines in the rovibrational spectrum. While the system is being developed for study of the products of radical-radical reactions, preliminary studies involved detection of HCl from reaction of Cl-atoms with organic species. The reaction Cl + C2H6 yields HCl + C2H5 (1) was studied to characterize the system and determine the detection limit for HCl. The rate coefficient, k1, was determined to be (5.9 +/- 0.4) X 10-11 cm3 molec-1s-1 in agreement with the recommended values. HCl (v equals 0) and HCl (V equals 1) were simultaneously measured as products of the reaction Cl + CH3CHO yields HCl + CH3CO (2) at 2906.247 cm-1 and 2906.337 cm-1 respectively. It was determined for this reaction that k2 equals (7.5 +/- 0.6) X 10-11 cm3molec-1s-1.

Paper Details

Date Published: 21 October 1996
PDF: 10 pages
Proc. SPIE 2834, Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring, (21 October 1996); doi: 10.1117/12.255316
Show Author Affiliations
Carla S. Kegley-Owen, Univ. of Colorado/Boulder (United States)
Geoffrey S. Tyndall, National Ctr. for Atmospheric Research (United States)
John J. Orlando, National Ctr. for Atmospheric Research (United States)
Alan Fried, National Ctr. for Atmospheric Research (United States)


Published in SPIE Proceedings Vol. 2834:
Application of Tunable Diode and Other Infrared Sources for Atmospheric Studies and Industrial Process Monitoring
Alan Fried, Editor(s)

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