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Proceedings Paper

Dispersion of picosecond pulses propagating on microstrip interconnections on semiconductor integrated-circuit substrates
Author(s): Michael F. Pasik; Andreas C. Cangellaris; John L. Prince
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Paper Abstract

A weighted residual formulation for the transverse electric field is presented for the finite-element analysis of microstrip transmission lines on semiconductor substrates. The frequency dependence of the effective dielectric constant and the attenuation constant of the transmission lines are examined. The results from the full-wave analysis are used to determine when a quasi-TEM analysis is applicable.

Paper Details

Date Published: 1 April 1991
PDF: 5 pages
Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); doi: 10.1117/12.25531
Show Author Affiliations
Michael F. Pasik, Univ. of Arizona (United States)
Andreas C. Cangellaris, Univ. of Arizona (United States)
John L. Prince, Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 1389:
Microelectronic Interconnects and Packages: Optical and Electrical Technologies
Gnanalingam Arjavalingam; James Pazaris, Editor(s)

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