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Proceedings Paper

Effects of conductor losses on cross-talk in multilevel-coupled VLSI interconnections
Author(s): T. Emilie van Deventer; Linda P.B. Katehi; Andreas C. Cangellaris
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Paper Abstract

The influence of conductor losses on the cross-talk between coupled microstrip lines is evaluated using an integral equation method. In this mathematical formulation the fields are computed inside the conductors and are utilized to define an equivalent impedance on the surface of the strips. This surface impedance is used as a boundary condition for the solution of the electromagnetic problem outside the conductors. Following this procedure the effect of losses on pulse dispersion in coupled microstrip lines is studied thoroughly for various geometries.

Paper Details

Date Published: 1 April 1991
PDF: 12 pages
Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); doi: 10.1117/12.25530
Show Author Affiliations
T. Emilie van Deventer, Univ. of Michigan (United States)
Linda P.B. Katehi, Univ. of Michigan (United States)
Andreas C. Cangellaris, Univ. of Arizona (United States)

Published in SPIE Proceedings Vol. 1389:
Microelectronic Interconnects and Packages: Optical and Electrical Technologies
Gnanalingam Arjavalingam; James Pazaris, Editor(s)

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