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Proceedings Paper

Electrical characteristics of lossy interconnections for high-performance computer applications
Author(s): Alina Deutsch; Gerard V. Kopcsay; V. A. Ranieri; J. K. Cataldo; E. A. Galligan; W. S. Graham; R. P. McGouey; S. L. Nunes; Jurij R. Paraszczak; J. J. Ritsko; R. J. Serino; D. Y. Shih; Janusz S. Wilczynski
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Paper Details

Date Published: 1 April 1991
PDF: 16 pages
Proc. SPIE 1389, Microelectronic Interconnects and Packages: Optical and Electrical Technologies, (1 April 1991); doi: 10.1117/12.25520
Show Author Affiliations
Alina Deutsch, IBM/Thomas J. Watson Research Ctr. (United States)
Gerard V. Kopcsay, IBM/Thomas J. Watson Research Ctr. (United States)
V. A. Ranieri, IBM/Thomas J. Watson Research Ctr. (United States)
J. K. Cataldo, IBM/Thomas J. Watson Research Ctr. (United States)
E. A. Galligan, IBM/Thomas J. Watson Research Ctr. (United States)
W. S. Graham, IBM/Thomas J. Watson Research Ctr. (United States)
R. P. McGouey, IBM/Thomas J. Watson Research Ctr. (United States)
S. L. Nunes, IBM/Thomas J. Watson Research Ctr. (United States)
Jurij R. Paraszczak, IBM/Thomas J. Watson Research Ctr. (United States)
J. J. Ritsko, IBM/Thomas J. Watson Research Ctr. (United States)
R. J. Serino, IBM/Thomas J. Watson Research Ctr. (United States)
D. Y. Shih, IBM/Thomas J. Watson Research Ctr. (United States)
Janusz S. Wilczynski, IBM/Thomas J. Watson Research Ctr. (United States)


Published in SPIE Proceedings Vol. 1389:
Microelectronic Interconnects and Packages: Optical and Electrical Technologies
Gnanalingam Arjavalingam; James Pazaris, Editor(s)

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