Share Email Print
cover

Proceedings Paper

PbSnSe-on-Si infrared techniques: improvements in materials and devices
Author(s): Hans Zogg; Alexander Fach; Joachim John; Peter Mueller; Carmine Paglino
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Progress in the development of narrow gap IV-VI-on-Si technology for infrared sensor arrays is reviewed. Epitaxial Pb1-xSnxSe layers, about 4 micrometer thick, are grown by molecular beam epitaxy onto 3 inch Si(111) substrates, and employing an intermediate CaF2 layer of only 2 nm thickness for compatibility reasons. Material quality is improved by proper growth conditions and annealing. Threading dislocation densities as low as 106 cm-2 are obtained in samples with 3 by 3 cm2 size after proper anneal. It seems that glissile threading dislocations sweep out across the edge of the samples, and, in addition, such dislocations are able to react with sessile ones and transform them to glissile. Infrared photodiodes with much higher resistance area products can be obtained which approach the theoretical limit in a certain temperature range with such improved material quality. If the Pb/Pb1-xSnxSe infrared Schottky-barrier sensors are described with a model which allows fluctuations of the barrier height, the saturation of the resistance-area products at low temperatures as well as ideality factors very much greater than 1 are explained, too.

Paper Details

Date Published: 22 October 1996
PDF: 4 pages
Proc. SPIE 2816, Infrared Detectors for Remote Sensing: Physics, Materials, and Devices, (22 October 1996); doi: 10.1117/12.255166
Show Author Affiliations
Hans Zogg, Swiss Federal Institute of Technology (Switzerland)
Alexander Fach, Swiss Federal Institute of Technology (Switzerland)
Joachim John, Swiss Federal Institute of Technology (Belgium)
Peter Mueller, Swiss Federal Institute of Technology (Switzerland)
Carmine Paglino, Swiss Federal Institute of Technology (Switzerland)


Published in SPIE Proceedings Vol. 2816:
Infrared Detectors for Remote Sensing: Physics, Materials, and Devices
Randolph E. Longshore; Jan W. Baars, Editor(s)

© SPIE. Terms of Use
Back to Top