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Proceedings Paper

Advances in 15-um HgCdTe photovoltaic and photoconductive detector technology for remote sensing
Author(s): Marion B. Reine; Eric E. Krueger; P. O'Dette; C. Lynne Terzis; Brian Denley; Jeanne M. Hartley; James H. Rutter; Douglas E. Kleinmann
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Paper Abstract

There has been significant progress during the past several years in photovoltaic (PV) HgCdTe technology for advanced long wavelength remote sensing applications. Useful cutoff wavelengths have been extended to beyond 17.0 micrometer. Junction quality has been improved to the point that D* greater than 3 multiplied by 1011 cm-(root)Hz/W can be achieved in arrays at temperatures of 60 - 65 K. The atmospheric infrared sounder (AIRS) instrument, scheduled for launch in the year 2000 as part of the NASA EOS Program, uses over 4000 PV HgCdTe detector elements organized into ten linear multiplexed arrays, with cutoff wavelengths extending as far as 15.0 micrometer at 60 K. The AIRS instrument also uses two long linear arrays of photoconductive (PC) HgCdTe detectors for the 13.7 - 15.4 micrometer band. These PC detector arrays have cutoff wavelengths of 16.0 - 17.0 micrometer and achieve D* values of 3 - 5 multiplied by 1011 cm-(root)Hz/W at 60 K. PV HgCdTe offers many advantages over PC HgCdTe for advanced remote sensing instruments: negligible 1/f noise, much higher impedance so that cold preamps or multiplexers are possible, configurational versatility with backside- illuminated two-dimensional arrays of closely spaced elements, 10X - 100X better linearity, dc coupling for measuring the total incident photon flux, and a (root)2 higher BLIP D* limit. In this paper we compare the relative merits of PV and PC HgCdTe for advanced remote sensing instruments, and we review recent data for both PV and PC HgCdTe arrays with cutoff wavelengths as long as 17.5 micrometer.

Paper Details

Date Published: 22 October 1996
PDF: 18 pages
Proc. SPIE 2816, Infrared Detectors for Remote Sensing: Physics, Materials, and Devices, (22 October 1996); doi: 10.1117/12.255160
Show Author Affiliations
Marion B. Reine, Lockheed Martin IR Imaging Systems (United States)
Eric E. Krueger, Lockheed Martin IR Imaging Systems (United States)
P. O'Dette, Lockheed Martin IR Imaging Systems (United States)
C. Lynne Terzis, Lockheed Martin IR Imaging Systems (United States)
Brian Denley, Lockheed Martin IR Imaging Systems (United States)
Jeanne M. Hartley, Lockheed Martin IR Imaging Systems (United States)
James H. Rutter, Lockheed Martin IR Imaging Systems (United States)
Douglas E. Kleinmann, Lockheed Martin IR Imaging Systems (United States)


Published in SPIE Proceedings Vol. 2816:
Infrared Detectors for Remote Sensing: Physics, Materials, and Devices
Randolph E. Longshore; Jan W. Baars, Editor(s)

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