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Proceedings Paper

Imaging interferometric spectroscopy for advanced missions
Author(s): Jerry Edelstein
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Paper Abstract

Shearing interferometric spectrometers can be used for all- reflective, high-resolution (R equals 104 - 106) spectroscopy. The spectrometers can provide simultaneous imaging and be used for both sensitive emission and absorption spectroscopy of diffuse and point sources. Our designs require interaction with only a single optical element to create interference fringes and so can be used in the EUV and FUV (100 - 2000 angstroms) bandpass. Spectral interferometers consume a fraction of the volume required by conventional spectrographs with comparable resolution and consequently provide a promising technique for space missions.

Paper Details

Date Published: 12 October 1996
PDF: 12 pages
Proc. SPIE 2807, Space Telescopes and Instruments IV, (12 October 1996); doi: 10.1117/12.255101
Show Author Affiliations
Jerry Edelstein, Univ. of California/Berkeley (United States)


Published in SPIE Proceedings Vol. 2807:
Space Telescopes and Instruments IV
Pierre Y. Bely; James B. Breckinridge, Editor(s)

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