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Proceedings Paper

Machine vision platform requirements for successful implementation and support in the semiconductor assembly manufacturing environment
Author(s): Christopher J. LeBeau
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Paper Abstract

In todays Semiconductor Manufacturing Industry it is becoming more difficult to utilize the human operator as the visual process control vehicle so as to cost-effectively achieve statistical process defect goals. Machine vision continues to make inroads cost-effectively improving manufacturing visual inspection requirements driving and sustaining desired process control capabilities. This paper will attempt to survey the attributes of automatic visual process monitoring within the Motorola Semiconductor Assembly Manufacturing environment. Such factors as defect control objectives inspection requirements vision engine platform application engineering and long-term application maintenance all of which contribute to the costeffectiveness of the automatic visual inspection task.

Paper Details

Date Published: 1 March 1991
PDF: 4 pages
Proc. SPIE 1386, Machine Vision Systems Integration in Industry, (1 March 1991); doi: 10.1117/12.25397
Show Author Affiliations
Christopher J. LeBeau, Motorola Inc. (United States)


Published in SPIE Proceedings Vol. 1386:
Machine Vision Systems Integration in Industry
Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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