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Proceedings Paper

Two stage object identification system in the Delft intelligent assembly cell
Author(s): Johannes Buurman; David J. W. Bierhuizen
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Paper Abstract

In a flexible assembly cell a vision system for part identification is required to be both fast and robust. The first requirement is met by using a verification system that generates hypotheses based on outside information and common object positions and accepts those if sufficient support can be found. However this system fails for all exceptional cases. These require a more genera! system. For this purpose a recognition system is used which tries to find the best matching mode! from the set of all possible models. The appropriate switching from verification to recognition is done by a control procedure which evaluates the following critena: . First the error rate of the verification system is minimised rejected cases by the verifIcation system lead to an activation of the recognition system. The error rate of recognition is related to the performance of the rest of the robot cell. S Second the execution time is optimised. This means that if the expected execution time of verification will exceed that of recognition recognition should be activated. This decision can be made both in advance and during verification. In general however verification should be faster. Verification of hypotheses is done in coarse-to-fine processing. The coarse step is done on information from an overlooking camera and uses simple binary images for speed purposes. The resulting hypothesis consists of an identity and 3D position and orientation information. Further

Paper Details

Date Published: 1 March 1991
PDF: 12 pages
Proc. SPIE 1386, Machine Vision Systems Integration in Industry, (1 March 1991); doi: 10.1117/12.25393
Show Author Affiliations
Johannes Buurman, Delft Univ. of Technology (Netherlands)
David J. W. Bierhuizen, Delft Univ. of Technology (Netherlands)


Published in SPIE Proceedings Vol. 1386:
Machine Vision Systems Integration in Industry
Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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