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Proceedings Paper

Subpixel measurement of image features based on paraboloid surface fit
Author(s): Shaun S. Gleason; Martin A. Hunt; William Bruce Jatko
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Paper Details

Date Published: 1 March 1991
PDF: 10 pages
Proc. SPIE 1386, Machine Vision Systems Integration in Industry, (1 March 1991); doi: 10.1117/12.25387
Show Author Affiliations
Shaun S. Gleason, Oak Ridge National Lab. (United States)
Martin A. Hunt, Oak Ridge National Lab. (United States)
William Bruce Jatko, Oak Ridge National Lab. (United States)


Published in SPIE Proceedings Vol. 1386:
Machine Vision Systems Integration in Industry
Bruce G. Batchelor; Frederick M. Waltz, Editor(s)

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