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Approaches for a destructive measurement method of subsurface damages (Conference Presentation)
Author(s): Michael Seiler

Paper Abstract

This Conference Presentation, "Approaches for a destructive measurement method of subsurface damages," was recorded at SPIE Optical Metrology 2019 held in Munich, Germany.

Paper Details

Date Published: 16 August 2019
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Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110561I (16 August 2019); doi: 10.1117/12.2537877
Show Author Affiliations
Michael Seiler, Ernst-Abbe-Hochschule Jena (Germany)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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