Share Email Print
cover

Proceedings Paper • new

A step toward a clinically viable ABI phase-contrast imaging: double emission line artifacts correction
Author(s): Oriol Caudevilla; Wei Zhou; Jovan G. Brankov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Analyzer-based phase–contrast imaging (ABI) is a promising X-ray imaging technique with huge potential for soft tissue imaging. Unfortunately, ABI requires quasi-monochromatic beam, which limits the beam photon budget, therefore imaging requires a long exposure time. In classical ABI imaging only one K-alpha emission line is permitted. Relaxing this requirement and even further by utilizing both K-alpha emission lines for imaging can significantly reduce the exposure time. However, accepting both emission lines introduce a double-image artifact due to the energy-angular difference between the emission lines. In this paper we introduce a method to correct for such artifacts and overcome one of the main design limitation of Analyzer-Based systems to achieve high quality phase-contrast mammograms in a clinically relevant time.

Paper Details

Date Published: 28 May 2019
PDF: 4 pages
Proc. SPIE 11072, 15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine, 1107219 (28 May 2019); doi: 10.1117/12.2534349
Show Author Affiliations
Oriol Caudevilla, Illinois Institute of Technology (United States)
Wei Zhou, Illinois Institute of Technology (United States)
Jovan G. Brankov, Illinois Institute of Technology (United States)


Published in SPIE Proceedings Vol. 11072:
15th International Meeting on Fully Three-Dimensional Image Reconstruction in Radiology and Nuclear Medicine
Samuel Matej; Scott D. Metzler, Editor(s)

© SPIE. Terms of Use
Back to Top