Share Email Print
cover

Proceedings Paper • new

Design of a two-mirror telescope using a free-form surface for the primary mirror
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The design of a two-mirror telescope using a free-form surface for the primary mirror, to obtain a compensation of the spherical and coma aberrations, in the entire pupil of the telescope is proposed. In this design, the conic constant (𝑘1 ) of the primary mirror is a function of the heights, measure from the center to the edge of primary mirror. In this method, we use the exact ray tracing to find the optical path length (OPL) for each ray that intersect the primary mirror at different distances measured from the center of the primary mirror. The OPL is calculated with the sum of the distances that each ray travels until reaching the plane of the image, and the sum of the distances for a paraxial axial ray. From the optical path difference (OPD) of a set of rays, we obtain a set of values of the conic constant that guarantees that the OPD has a value of zero for each incident ray height. With the set of values of the conic constant it is possible to obtain the shape of the surface of the primary mirror.

Paper Details

Date Published: 21 June 2019
PDF: 10 pages
Proc. SPIE 11057, Modeling Aspects in Optical Metrology VII, 110571T (21 June 2019); doi: 10.1117/12.2534326
Show Author Affiliations
J. J. Alvarado-Martínez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
F. S. Granados-Agustín, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
S. Vázquez-Montiel, Univ. Interserrana del Estado de Puebla Ahuacatlán (Mexico)
M. E. Percino-Zacarías, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)
A. Cornejo-Rodríguez, Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)


Published in SPIE Proceedings Vol. 11057:
Modeling Aspects in Optical Metrology VII
Bernd Bodermann; Karsten Frenner; Richard M. Silver, Editor(s)

© SPIE. Terms of Use
Back to Top