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The influence of detector’s integration time on the laser disturbing effect
Author(s): Y. Wang; Q. Chen; G. Xu; G. Ren; X. Zhou; H. Li; R. Zhu
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Paper Abstract

For the first time, the influence of optoelectronic detector’s integration time on laser disturbing effect has been comparatively investigated under the low repetition rate laser, the high repetition rate laser and the continuous-wave laser in the experiment. In the low repetition rate laser disturbing, the correlation coefficients of laser disturbing effect are all above 0.96 under the different integration time, however, the pixel numbers of the different grey levels gradually increase with the extension of integration time. In the high repetition rate laser or continuous-wave laser disturbing, there are two different phases that both the correlation coefficients and the pixel numbers of different grey levels change with the increase of integration time: the correlation coefficients rapidly decrease and the pixel numbers quickly increase when the integration time is below 10ms in the first phase; the correlation coefficients linearly decrease and the pixel numbers increase when the integration time is above 10ms in the second phase.

Paper Details

Date Published: 17 May 2019
PDF: 10 pages
Proc. SPIE 11170, 14th National Conference on Laser Technology and Optoelectronics (LTO 2019), 111701Z (17 May 2019); doi: 10.1117/12.2533569
Show Author Affiliations
Y. Wang, Luoyang Electronic Equipment Test Ctr. of China (China)
Q. Chen, Luoyang Electronic Equipment Test Ctr. of China (China)
G. Xu, Luoyang Electronic Equipment Test Ctr. of China (China)
G. Ren, Luoyang Electronic Equipment Test Ctr. of China (China)
X. Zhou, Luoyang Electronic Equipment Test Ctr. of China (China)
H. Li, Luoyang Electronic Equipment Test Ctr. of China (China)
R. Zhu, Luoyang Electronic Equipment Test Ctr. of China (China)


Published in SPIE Proceedings Vol. 11170:
14th National Conference on Laser Technology and Optoelectronics (LTO 2019)
Jianqiang Zhu; Weibiao Chen; Zhenxi Zhang; Minlin Zhong; Pu Wang; Jianrong Qiu, Editor(s)

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