Share Email Print

Proceedings Paper

Compensation method of antiferroelectric liquid crystal device characteristic variation caused by temperature changing
Author(s): Weisong Zhao; Ruipeng Sun; Jianxin Guo; Xinmin Huang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The antiferroelectric liquid crystal (AFLC) display is promising for it's tristable switching, no-ghost effect and good mechanical stability. Recently, Yamamoto et al. have realized the full-color AFLC display with analog gradation based on in-pixel domain switching. One of the advantages of AFLC device compared with FLC device is that it can realize gray level display. But AFLCD characteristics has dependence of temperature. In our experiment, AFLCD was prepared to study this problem. The panel's threshold voltage, cone angle, response time, contrast ratio and electro-optical curves was measured at variable temperature. And we discussed the mechanism of gray level's distortion while the temperature changed in the case of the same driving scheme applied. At last we brought out a proposal to solve this problem. The electro-optic curves of AFLCD in a temperature range was measured. Some temperature sensors were put on the panel to detect it's temperature, and we set a temperature standard. Compared the detected temperature and the standard, and then adjust the electric wave forms to get the same gray levels at variable temperature.

Paper Details

Date Published: 30 September 1996
PDF: 6 pages
Proc. SPIE 2892, Display Devices and Systems, (30 September 1996); doi: 10.1117/12.253343
Show Author Affiliations
Weisong Zhao, Changchun Institute of Physics (China)
Ruipeng Sun, Changchun Institute of Physics (China)
Jianxin Guo, Changchun Institute of Physics (China)
Xinmin Huang, Changchun Institute of Physics (China)

Published in SPIE Proceedings Vol. 2892:
Display Devices and Systems
Eric G. Lean; Zhiren Tian; Bao Gang Wu, Editor(s)

© SPIE. Terms of Use
Back to Top