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Proceedings Paper

Neural net selection of features for defect inspection
Author(s): Kenji Sasaki; David P. Casasent; Sanjay S. Natarajan
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Paper Details

Date Published: 1 February 1991
PDF: 6 pages
Proc. SPIE 1384, High-Speed Inspection Architectures, Barcoding, and Character Recognition, (1 February 1991); doi: 10.1117/12.25327
Show Author Affiliations
Kenji Sasaki, Toshiba Corp. (United States)
David P. Casasent, Carnegie Mellon Univ. (United States)
Sanjay S. Natarajan, Carnegie Mellon Univ. (United States)


Published in SPIE Proceedings Vol. 1384:
High-Speed Inspection Architectures, Barcoding, and Character Recognition
Michael J. W. Chen, Editor(s)

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