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Proceedings Paper

Optical properties of barcode symbols for laser scanning
Author(s): Anna Marie Quinn; Jay M. Eastman
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Paper Abstract

Not all bar code symbols are alike. This paper will discuss the characteristics of bar code symbols which can make or break a bar code laser scanner''s performance in a specific application. These characteristics can be broken down into three catergories: Substrates " inks" ( inks toners dyes etc. ) and the light source used to read the symbol. The characteristics of the substrate can be further separated into three groups: the medium used the scattering properties of the the medium and overlaminates. Intrinsic properties of the medium can include " paper noise" resulting from the grain of paper metal grain or a retro-reflective background. Scattering characteristics cover angular distribution of the scattered light absolute scatter levels from the substrate internal scatter and specularly reflected light. Overlaminates contribute their own assets and liabilities in successfully choosing a scanner that will perform for all your needs. The inks used and the light source utilized work in conjunction with each other in determining the performance of a laser scanner. The spectral characteristics and composition of the ink determine which light source the scanner must employ to be used to successfully interpret the symbol. The three common light sources available in laser bar code scanners are helium-neon lasers visible laser diodes and infra-red laser diodes. Experimental data will be presented illustrating the optical properties discussedIbove.

Paper Details

Date Published: 1 February 1991
PDF: 7 pages
Proc. SPIE 1384, High-Speed Inspection Architectures, Barcoding, and Character Recognition, (1 February 1991); doi: 10.1117/12.25317
Show Author Affiliations
Anna Marie Quinn, Photographic Sciences Corp. (United States)
Jay M. Eastman, Photographic Sciences Corp. (United States)


Published in SPIE Proceedings Vol. 1384:
High-Speed Inspection Architectures, Barcoding, and Character Recognition
Michael J. W. Chen, Editor(s)

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