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Reducing burn-in loss in organic photovoltaics by enhancing the morphological and interfacial stability (Conference Presentation)
Author(s): Kyungkon Kim

Paper Abstract

With rapid advances in the development of new conjugated polymers, non-fullerene acceptors, the power conversion efficiency (PCE) of OPVs has been increased over 14%. However, a major drawback for the commercialization of OPVs is their long-term stability under continuous operation. Especially, OPVs suffer from a rapid decrease in PCE during initial device operation, which is known as the “burn-in loss”. It is considered that the origin of the burn-in loss is mainly related with the instability of the BHJ morphology and/or interface rather than the photooxidation of the photoactive layer. We find that the photoactive layer prepared by a sequential solution deposition is more stable than that prepared by blend solution deposition. We also find that the burn-in loss is closely related with stability of photoactive layer / electron transporting layer interface.

Paper Details

Date Published: 10 September 2019
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Proc. SPIE 11094, Organic, Hybrid, and Perovskite Photovoltaics XX, 1109411 (10 September 2019); doi: 10.1117/12.2531612
Show Author Affiliations
Kyungkon Kim, Ewha Womans Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 11094:
Organic, Hybrid, and Perovskite Photovoltaics XX
Zakya H. Kafafi; Paul A. Lane; Kwanghee Lee; Ana Flávia Nogueira, Editor(s)

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