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Proceedings Paper

Parsing algorithm for line-drawing pattern recognition
Author(s): Patrick S. P. Wang; Y. Y. Zhang
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Paper Details

Date Published: 1 February 1991
PDF: 7 pages
Proc. SPIE 1384, High-Speed Inspection Architectures, Barcoding, and Character Recognition, (1 February 1991); doi: 10.1117/12.25311
Show Author Affiliations
Patrick S. P. Wang, Massachusetts Institute of Technology (United States)
Y. Y. Zhang, Northeastern Univ. (United States)


Published in SPIE Proceedings Vol. 1384:
High-Speed Inspection Architectures, Barcoding, and Character Recognition
Michael J. W. Chen, Editor(s)

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