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Proceedings Paper

Large deformation measurement using ESPI
Author(s): Koji Tenjimbayashi
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Paper Abstract

This paper shows that the electronic speckle pattern interferometry (ESPI) using large capacity image memory makes possible to measure the large deformation distribution of a rough surface object precisely. A simple experiment to measure the large deformation of a cantilever which cannot be measured by a conventional ESPI is performed and its analysis shows the measurement error is small.

Paper Details

Date Published: 30 September 1996
PDF: 8 pages
Proc. SPIE 2888, Laser Processing of Materials and Industrial Applications, (30 September 1996); doi: 10.1117/12.253106
Show Author Affiliations
Koji Tenjimbayashi, Mechanical Enginneering Lab. (Japan)


Published in SPIE Proceedings Vol. 2888:
Laser Processing of Materials and Industrial Applications
Shu-Sen Deng; S. C. Wang, Editor(s)

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