Share Email Print
cover

Proceedings Paper

Modulation transfer function measuring of charge-coupled devices using laser speckle
Author(s): Minghua Liu; Wenlong Zhen; Yinzhong Liang; Mozhi Yu; Ping'an He; Changjun Cheng
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Based on the statistical properties of laser speckle, the response for laser speckle passing through a linear shift- invariant system is studied. This paper presents a method for testing the modulation transfer function (MTF) of charge-coupled devices below the Nyquist frequency. A new scattering microcrystalline glass material generates laser speckle. The instrument is designed and test results show that this technique is a variable MTF measurement approach. The difference of the results of each test is within 0.03.

Paper Details

Date Published: 3 October 1996
PDF: 8 pages
Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); doi: 10.1117/12.253095
Show Author Affiliations
Minghua Liu, Wuhan Technical Univ. of Surveying and Mapping (China)
Wenlong Zhen, Wuhan Technical Univ. of Surveying and Mapping (China)
Yinzhong Liang, Wuhan Technical Univ. of Surveying and Mapping (China)
Mozhi Yu, Wuhan Technical Univ. of Surveying and Mapping (China)
Ping'an He, Wuhan Technical Univ. of Surveying and Mapping (China)
Changjun Cheng, Wuhan Technical Univ. of Surveying and Mapping (China)


Published in SPIE Proceedings Vol. 2899:
Automated Optical Inspection for Industry
Frederick Y. Wu; Shenghua Ye, Editor(s)

© SPIE. Terms of Use
Back to Top