Share Email Print

Proceedings Paper

Comprehensive test of low-level-light image intensifiers
Author(s): Yu Liu; Yueqin Ma; Junyan Jiang; Jifang Shi
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A comprehensive test system with unitary light source is described, which is a combination structure. The system can provide the whole function of formerly several common instruments for the test of image tubes. It can test the light quantum parameters, such as photo cathode sensitivity, luminance gain, automatic brightness control specification, equivalent background input, signal-to-noise ratio and output brightness uniformity, and geometry parameters, such as resolution, distortion, image alignment and magnification. The measuring uncertainty of the parameters is 1.7 percent to approximately 3.7 percent. The total uncertainty of system is 4.6 percent. On the basis of the structure designed, the system can be developed to an automatic instrument for testing the optical-electric performance of low-level-light image intensifiers.

Paper Details

Date Published: 3 October 1996
PDF: 12 pages
Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); doi: 10.1117/12.253086
Show Author Affiliations
Yu Liu, Xi'an Institute of Applied Optics (China)
Yueqin Ma, Xi'an Institute of Applied Optics (China)
Junyan Jiang, Xi'an Institute of Applied Optics (China)
Jifang Shi, Xi'an Institute of Applied Optics (China)

Published in SPIE Proceedings Vol. 2899:
Automated Optical Inspection for Industry
Frederick Y. Wu; Shenghua Ye, Editor(s)

© SPIE. Terms of Use
Back to Top