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Collaborative development of diffraction-limited beamline optical systems at US DOE light sources
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Paper Abstract

An ongoing collaboration among four US Department of Energy (DOE) National Laboratories has demonstrated key technology prototypes and software modeling tools required for new high-coherent flux beamline optical systems. New free electron laser (FEL) and diffraction-limited storage ring (DLSR) light sources demand wavefront preservation from source to sample to achieve and maintain optimal performance. Fine wavefront control was achieved using a novel, roomtemperature cooled mirror system called REAL (resistive element adjustable length) that combines cooling with applied, spatially variable auxiliary heating. Single-grating shearing interferometry (also called Talbot interferometry) and Hartmann wavefront sensors were developed and used for optical characterization and alignment on several beamlines, across a range of photon energies. Demonstrations of non-invasive hard x-ray wavefront sensing were performed using a thin diamond single-crystal as a beamsplitter.

Paper Details

Date Published: 9 September 2019
PDF: 17 pages
Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090C (9 September 2019); doi: 10.1117/12.2530817
Show Author Affiliations
Kenneth A. Goldberg, Lawrence Berkeley National Lab. (United States)
Antoine Wojdyla, Lawrence Berkeley National Lab. (United States)
Diane Bryant, Lawrence Berkeley National Lab. (United States)
Weilun Chao, Lawrence Berkeley National Lab. (United States)
Daniele Cocco, Lawrence Berkeley National Lab. (United States)
SLAC National Accelerator Lab. (United States)
Corey Hardin, SLAC National Accelerator Lab. (United States)
Daniel Morton, SLAC National Accelerator Lab. (United States)
May Ling Ng, SLAC National Accelerator Lab. (United States)
Lance Lee, SLAC National Accelerator Lab. (United States)
Lahsen Assoufid, Argonne National Lab. (United States)
Walan Grizolli, Argonne National Lab. (United States)
Xianbo Shi, Argonne National Lab. (United States)
Steve P. Kearney, Argonne National Lab. (United States)
Michael Wojcik, Argonne National Lab. (United States)
Yuri Shvyd'ko, Argonne National Lab. (United States)
Deming Shu, Argonne National Lab. (United States)
Mourad Idir, Brookhaven National Lab. (United States)
Lei Huang, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 11109:
Advances in Metrology for X-Ray and EUV Optics VIII
Lahsen Assoufid; Haruhiko Ohashi; Anand Asundi, Editor(s)

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