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Proceedings Paper

Using focused light to determine the refractive index of materials by total internal reflection
Author(s): Hui Li; Shusen Xie; Yishen Qiu
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Paper Abstract

A method based on total internal reflection is presented for determining the refractive index of materials. A focused light beam and a semicyclindrical lens in contact with materials are used in the experimental apparatus. The dependence of the internal reflective intensity or reflectivity on the angle of incidence is measured by a photodetector, e.g. linear CCD camera. The critical angle and therefore the refractive index can be obtained from the spacial distribution of internal reflective light. If a monochrometer is chosen as the light source, the chromatic dispersion curve of materials can be determined directly and quickly. The simple method can easily be controlled by computer techniques and applied to both tiny transparent and opaque samples whether they are solid or liquid. The several experimental results have shown that the method is reliable and very useful. It will play a role in many areas relative to the refractive index.

Paper Details

Date Published: 3 October 1996
PDF: 4 pages
Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); doi: 10.1117/12.253078
Show Author Affiliations
Hui Li, Fujian Normal Univ. (China)
Shusen Xie, Fujian Normal Univ. (China)
Yishen Qiu, Fujian Normal Univ. (China)


Published in SPIE Proceedings Vol. 2899:
Automated Optical Inspection for Industry
Frederick Y. Wu; Shenghua Ye, Editor(s)

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