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Proceedings Paper

Research on a semiconductor laser-scanned multifunctional online inspection system
Author(s): Congzhou Zhang; Zhiyong An; Gouyu Zhang; Xiping Xu
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Paper Abstract

The paper describes the basic principle and overall structure of a semiconductor laser-scanned multi-functional on-line inspection system, which is used to realize high speed and high accuracy, non-contact and on-line inspection for rotating body type of parts and various formal and positional errors by using semiconductor laser-scanned principle. It mainly discusses the following three aspects: first, laser-scanned emitting system composed of a semiconductor laser, a laser power source, a scanner and a scanning optical system; secondary, a laser-scanned receiving system composed of a receiving optical system and an optoelectronic converting electronic system; thirdly, a master controlling system with micro-controller as the core, real-time control and data processing system.

Paper Details

Date Published: 3 October 1996
PDF: 6 pages
Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); doi: 10.1117/12.253069
Show Author Affiliations
Congzhou Zhang, Changchun Institute of Optics and Fine Mechanics (China)
Zhiyong An, Changchun Institute of Optics and Fine Mechanics (China)
Gouyu Zhang, Changchun Institute of Optics and Fine Mechanics (China)
Xiping Xu, Changchun Institute of Optics and Fine Mechanics (China)

Published in SPIE Proceedings Vol. 2899:
Automated Optical Inspection for Industry
Frederick Y. Wu; Shenghua Ye, Editor(s)

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