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Proceedings Paper

Automated visual inspection system for IC bonding wires using morphological processing
Author(s): Hiroyuki Tsukahara; Masato Nakashima; Takehisa Sugawara
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Paper Details

Date Published: 1 February 1991
PDF: 12 pages
Proc. SPIE 1384, High-Speed Inspection Architectures, Barcoding, and Character Recognition, (1 February 1991); doi: 10.1117/12.25306
Show Author Affiliations
Hiroyuki Tsukahara, Fujitsu Labs. Ltd., Atsugi (Japan)
Masato Nakashima, Fujitsu Labs. Ltd., Atsugi (Japan)
Takehisa Sugawara, Fujitsu Ltd. (Japan)


Published in SPIE Proceedings Vol. 1384:
High-Speed Inspection Architectures, Barcoding, and Character Recognition
Michael J. W. Chen, Editor(s)

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