Share Email Print
cover

Proceedings Paper

New method for measuring the properties of optical systems with micro-optic components
Author(s): Weijian Tian; Jianwen Yang; Zhengkang Bao; Hedong Zhang; Bo Chen; Lurong Guo
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Utilizing micro-optics components, a new technique for measuring the properties of optical system is developed in this paper. The micro-optics components have been composed of a microlens array and a matched array of pinholes. Passing through the micro-optics array components, the light beam projects into the tested optical system, and is detected as a power spectrum by CCD plane array at last. By processing and analyzing the information from CCD detector, some main properties of tested optical system can be obtained. The experimental results are satisfactory due to the 2D plane symmetry and high power efficiency of the micro-optics array components.

Paper Details

Date Published: 3 October 1996
PDF: 6 pages
Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); doi: 10.1117/12.253050
Show Author Affiliations
Weijian Tian, Zhejiang Univ. (China)
Jianwen Yang, Zhejiang Univ. (China)
Zhengkang Bao, Zhejiang Univ. (China)
Hedong Zhang, Zhejiang Univ. (China)
Bo Chen, Sichuan Union Univ. (China)
Lurong Guo, Sichuan Union Univ. (China)


Published in SPIE Proceedings Vol. 2899:
Automated Optical Inspection for Industry
Frederick Y. Wu; Shenghua Ye, Editor(s)

© SPIE. Terms of Use
Back to Top