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Proceedings Paper

Advancement of black-spot method for testing veiling glare
Author(s): Fengchun Li; Guoyu Zhang; Yujin Gao
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Paper Abstract

The veiling glare of an optical system is the major specification for appraising its image quality. Black-spot method for measuring the veiling glare is a currently common-used technique. Instability in the power supply and devices directly affects the measuring accuracy. Comparing the two beams from a same source of light, using a bridge differential circuit, displaying the balance with a galvanometer, and taking the resistance with a precision resistance box, we can calculate the veiling glare index. It is proved by the calculation and experiments that the measuring accuracy is as high as 10-4.

Paper Details

Date Published: 3 October 1996
PDF: 7 pages
Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); doi: 10.1117/12.253047
Show Author Affiliations
Fengchun Li, Changchun Institute of Optics and Fine Mechanics (China)
Guoyu Zhang, Changchun Institute of Optics (China)
Yujin Gao, Changchun Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 2899:
Automated Optical Inspection for Industry
Frederick Y. Wu; Shenghua Ye, Editor(s)

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