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Life testing of conventional and atomic layer deposition functionalized microchannel plates
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Paper Abstract

We report on life testing of conventional microchannel plates (MCPs) and atomic layer deposition (ALD) MCPs. For the Global-scale Observations of the Limb and Disk (GOLD) mission, long-duration, deep charge extraction testing was performed on a Z-stack triplet of 12 μm pore conventional MCPs with a CsI photocathode on the top surface. A relatively low gain (≈1000e-), modest charge extraction (0.07 C/cm2) full-field conditioning burn-in was performed followed by a very deep narrow line burn-in to emulate a GOLD spectral line. The gain local to the line burn-in decreased by ≈20% over ≈1 C/cm2 of extracted charge, and then remained stable (to 95 C/cm2). We also present the performance of several sets of 20 μm pore ALD MCPs with MgO secondary electron emission layers through full-field conditioning burn-ins at both full gain and low gain.

Paper Details

Date Published: 9 September 2019
PDF: 13 pages
Proc. SPIE 11118, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI, 111180P (9 September 2019); doi: 10.1117/12.2529517
Show Author Affiliations
Jason B. McPhate, Univ. of California, Berkeley (United States)
Nathan T. Darling, Univ. of California, Berkeley (United States)
Travis L. Curtis, Univ. of California, Berkeley (United States)
Catriana Paw U, Univ. of California, Berkeley (United States)
Casey Vo, Univ. of California, Berkeley (United States)
Gillean Graves, Univ. of California, Berkeley (United States)
Oswald H. W. Siegmund, Univ. of California, Berkeley (United States)
Camden Ertley, Incom, Inc. (United States)


Published in SPIE Proceedings Vol. 11118:
UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XXI
Oswald H. Siegmund, Editor(s)

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