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Improving the transmission efficiency of plasmonic and dielectric metasurfaces (Conference Presentation)

Paper Abstract

Transmissive-type metasurfaces represent an ultrathin alternative to traditional optical elements, e.g., lenses and waveplates. However, transmissive-type plasmonic metasurfaces (PMs) have significantly low efficiency compared to dielectric metasurfaces and reflective type PMs particularly in the visible range. For example, the state-of-the-art geometric PMs transmission efficiency is ≤10% with extinction ratios ~ 0 dB. The low transmission efficiency is mainly due to three loss channels (i) absorption losses in metals, (ii) diffraction to undesired high-orders, and most importantly (iii) symmetric forward-backward scattering which puts a 25% theoretical limit on cross-polarization conversion for ultrathin metasurfaces. We use tunable, multipole-interference-based meta-atoms to address all loss channels simultaneously. The experimentally demonstrated transmission efficiency and extinction ratio of our geometric PM are 42.3% and 7.8dB, respectively. As for dielectric metasurfaces, we demonstrate a new class of metasurfaces where the meta-atoms consist of a simple anti-reflective coating (ARC). ARCs enable the control over the entire 2 pi phase range by varying the dielectric films thicknesses while realizing ~ 99% transmission efficiency even in the visible range. The metasurface consists of patches of ARC meta-atoms with dielectric optical thicknesses much lower than that required in Fresnel optics to control the entire phase range.

Paper Details

Date Published: 9 September 2019
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Proc. SPIE 11080, Metamaterials, Metadevices, and Metasystems 2019, 110800Z (9 September 2019); doi: 10.1117/12.2528330
Show Author Affiliations
Mohamed El Kabbash, Univ. of Rochester (United States)
Chunlei Guo, Univ. of Rochester (United States)
Jihua Zhang, Univ. of Rochester (United States)


Published in SPIE Proceedings Vol. 11080:
Metamaterials, Metadevices, and Metasystems 2019
Nader Engheta; Mikhail A. Noginov; Nikolay I. Zheludev, Editor(s)

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