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X-ray microscopy instrumentation developments at NSLS-II: recent progress and future directions
Author(s): E. Nazaretski; W. Xu; H. Yan; X. Huang; Wei Xu; N. Bouet; J. Zhou; D. S. Coburn; W. -K. Lee; M. Ge; L. Huang; M. Idir; Y. S. Chu
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Paper Abstract

X-ray microscopy is a mature characterization tool routinely used to answer various questions of science, technology and engineering. The high penetration power of X-rays allows to utilize different characterization methods and reveal elemental composition, crystalline phases, strain distribution, oxidation states etc. in macroscopic and microscopic samples. To obtain comprehensive chemical and structural information at the nanometer scale an X-ray microscope must be equipped with adequate capabilities and allow acquisition of multiple datasets simultaneously. Full-field or scanning X-ray microscopes usually serve this purpose and complement each other. In the recent years, a number of X-ray microscopes have been designed, constructed and commissioned at NSLS-II. In this work we provide an overview of the microscopy instrumentation developments at NSLS-II. It includes the multilayer Laue Lens based nanoprobe optimized for 10 nm spatial resolution imaging, it’s current status and future upgrades; the zone plate based full-field imaging system capable of nano-tomography measurements in less than 1 minute; a laser scanning system optimized for ptychography measurements along with algorithms development, and a new Kirkpatrick-Baez based scanning microscope designed for sub-100 nm spatial resolution experiments.

Paper Details

Date Published: 9 September 2019
PDF: 7 pages
Proc. SPIE 11112, X-Ray Nanoimaging: Instruments and Methods IV, 111120M (9 September 2019); doi: 10.1117/12.2528166
Show Author Affiliations
E. Nazaretski, Brookhaven National Lab. (United States)
W. Xu, Brookhaven National Lab. (United States)
H. Yan, Brookhaven National Lab. (United States)
X. Huang, Brookhaven National Lab. (United States)
Wei Xu, Brookhaven National Lab. (United States)
N. Bouet, Brookhaven National Lab. (United States)
J. Zhou, Brookhaven National Lab. (United States)
D. S. Coburn, Brookhaven National Lab. (United States)
W. -K. Lee, Brookhaven National Lab. (United States)
M. Ge, Brookhaven National Lab. (United States)
L. Huang, Brookhaven National Lab. (United States)
M. Idir, Brookhaven National Lab. (United States)
Y. S. Chu, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 11112:
X-Ray Nanoimaging: Instruments and Methods IV
Barry Lai; Andrea Somogyi, Editor(s)

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