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Optic-electronic system for measurement the position of Millimetron’s space telescope segments of main mirror
Author(s): Gleb Vasilev; Igor Konyakhin
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Paper Abstract

The metrological maintenance of many measurement tasks requires measuring spatial position of some control objects relative to rigid base. The microwave radio-telescope development requires high-precision control for the position of the counter-reflector in relation to main mirror. The construction elements weight and thermal deformation leads to changes of position and linear shift of each planar section relative to theoretical parabola. Nowadays international project Millimetron led by the Russian Space Agency is developing. In case of originality of Millimetron construction is necessary to realize special system for controlling its segments’ positions. The triangulation method is chosen to solve this problem. This method means CMOS cameras, placed on the base ring close to the top of main mirror. On every segment there are placed three emission diodes, determining its spatial position. In accordance to the method video camera measures the LED vision angles. Every video camera measures position of two adjacent parts of main mirror. Measuring channel consists of two nearby cameras with crossed angle fields of view. The experimental research of the structure of the system error was made with the made computer model. There are two parts described in this article. First one is discussion on algorithm of detection images of control points and calculation its coordinates. Second one is about analysis are the primary errors influencing the error of linear and angular position measurements of control object. The results of computer modeling and research of experiment sample are discussed

Paper Details

Date Published: 21 June 2019
PDF: 7 pages
Proc. SPIE 11056, Optical Measurement Systems for Industrial Inspection XI, 110562X (21 June 2019); doi: 10.1117/12.2527535
Show Author Affiliations
Gleb Vasilev, ITMO Univ. (Russian Federation)
Igor Konyakhin, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 11056:
Optical Measurement Systems for Industrial Inspection XI
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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