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Validation of an infrared sensor model with field collected imagery of unresolved unmanned aerial vehicle (UAV) targets
Author(s): H. Gemar; R. Driggers; G. Tener; C. Halford; N. Fudala; J. Hewitt; R. Short; T. Pace; D. Manville; D. Shelton; M. Theisen; D. Gaudiosi; C. Olson
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Paper Abstract

An IR sensor model is validated using experimentally derived peak pixel SNR versus range for detection of either an unresolved or a resolved UAV target. The model provided estimated time-averaged peak SNR values for the ranges used in the field collection. A MWIR camera and a LWIR camera provided the measured data. Commercially available UAVs were flown along a line from the cameras to a clear sky region for background. A laser range finder measured the range at seven stopping points along the path. The data resulted in five ranges of unresolved target information for the MWIR camera and four ranges for the LWIR camera. This paper provides details for using the data collected from the model to match the cameras used in the field collection. Also, the processing used to extract peak SNR versus range from imagery is presented.

Paper Details

Date Published: 14 May 2019
PDF: 14 pages
Proc. SPIE 11001, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX, 110010E (14 May 2019); doi: 10.1117/12.2527191
Show Author Affiliations
H. Gemar, Univ. of Central Florida (United States)
R. Driggers, Univ. of Central Florida (United States)
G. Tener, L3 Technologies, Inc. (United States)
C. Halford, The Univ. of Memphis (United States)
N. Fudala, Univ. of Central Florida (United States)
J. Hewitt, Univ. of Central Florida (United States)
R. Short, Univ. of Central Florida (United States)
T. Pace, L3 Technologies, Inc. (United States)
D. Manville, L3 Technologies, Inc. (United States)
D. Shelton, L3 Technologies, Inc. (United States)
M. Theisen, L-3 Sonoma EO (United States)
D. Gaudiosi, L-3 Sonoma EO (United States)
C. Olson, L-3 Sonoma EO (United States)


Published in SPIE Proceedings Vol. 11001:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX
Gerald C. Holst; Keith A. Krapels, Editor(s)

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