Share Email Print
cover

Proceedings Paper • new

Measurement of freeforms and complex geometries by use of tactile profilometry and multi-wavelength interferometry
Author(s): Marc Wendel
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A comparison of two different measurement approaches, a tactile profilometer as well as a non-contact point-probe based metrology system, is conducted. The properties of each approach are highlighted, and measurement results examined.

Paper Details

Date Published: 28 June 2019
PDF: 7 pages
Proc. SPIE 11171, Sixth European Seminar on Precision Optics Manufacturing, 1117109 (28 June 2019); doi: 10.1117/12.2526734
Show Author Affiliations
Marc Wendel, Ametek GmbH (Germany)


Published in SPIE Proceedings Vol. 11171:
Sixth European Seminar on Precision Optics Manufacturing
Rolf Rascher; Christian Schopf, Editor(s)

© SPIE. Terms of Use
Back to Top