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Determination of rough microstructures on the surface of metals using the light scattering method in waveguides
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Paper Abstract

In this paper, we present the main results for the theoretical, numerical and experimental analysis of a new method to measure the roughness of metal surfaces. The requirements for a waveguide optical resonator, which is the main optical node of the device implementing this method, have been developed. A comparative analysis of two different designs of an optical node is performed. The energy spectra of the roughness of various surfaces were measured. As a result of the research, the main advantages of the method under consideration and practical recommendations are provided to improve the design of the device that implements this method.

Paper Details

Date Published: 30 August 2019
PDF: 8 pages
Proc. SPIE 11104, Current Developments in Lens Design and Optical Engineering XX, 111040H (30 August 2019); doi: 10.1117/12.2526123
Show Author Affiliations
N. Espinosa, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
C. Vega, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
J. Álvarez, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
P. León, Univ. de las Fuerzas Armadas-ESPE (Ecuador)
J. Vila, Univ. de las Fuerzas Armadas-ESPE (Ecuador)


Published in SPIE Proceedings Vol. 11104:
Current Developments in Lens Design and Optical Engineering XX
R. Barry Johnson; Virendra N. Mahajan; Simon Thibault, Editor(s)

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